JPS6311652Y2 - - Google Patents

Info

Publication number
JPS6311652Y2
JPS6311652Y2 JP1981145435U JP14543581U JPS6311652Y2 JP S6311652 Y2 JPS6311652 Y2 JP S6311652Y2 JP 1981145435 U JP1981145435 U JP 1981145435U JP 14543581 U JP14543581 U JP 14543581U JP S6311652 Y2 JPS6311652 Y2 JP S6311652Y2
Authority
JP
Japan
Prior art keywords
differential
flaw
detection
circuit
detection elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP1981145435U
Other languages
English (en)
Japanese (ja)
Other versions
JPS5849250U (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14543581U priority Critical patent/JPS5849250U/ja
Publication of JPS5849250U publication Critical patent/JPS5849250U/ja
Application granted granted Critical
Publication of JPS6311652Y2 publication Critical patent/JPS6311652Y2/ja
Granted legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP14543581U 1981-09-30 1981-09-30 探傷装置 Granted JPS5849250U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14543581U JPS5849250U (ja) 1981-09-30 1981-09-30 探傷装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14543581U JPS5849250U (ja) 1981-09-30 1981-09-30 探傷装置

Publications (2)

Publication Number Publication Date
JPS5849250U JPS5849250U (ja) 1983-04-02
JPS6311652Y2 true JPS6311652Y2 (en]) 1988-04-05

Family

ID=29938366

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14543581U Granted JPS5849250U (ja) 1981-09-30 1981-09-30 探傷装置

Country Status (1)

Country Link
JP (1) JPS5849250U (en])

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014202483A (ja) * 2013-04-01 2014-10-27 大阪瓦斯株式会社 検査装置及び検査方法

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56122938A (en) * 1980-02-29 1981-09-26 Shimadzu Corp Flaw detecting method and defectoscope

Also Published As

Publication number Publication date
JPS5849250U (ja) 1983-04-02

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